Description:  This shows a pair of tiny silicon carbide beams linked by a connect- ing beam. When current passes through one of the beams via a gold electrode, the motion caused by the flowing electrons can be detected by the parallel beam.
Source:  California Institute of Technology
Story:  Harder chips make more sensitive sensors
TRN February 14, 2001
TRN Categories:  Semiconductors and Materials; Microelectromechanical Systems (MEMS)
Form:  Still

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